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Digital LCD metallurgical microscope
Quick Details
  • Place of Origin:
  • Shandong, China (Mainland)
  • Brand Name:
  • HIPROVE
  • Model Number:
  • HIP-XJP-607
  • Theory:
  • Metallurgical Microscope
  • Drawtube:
  • Binocular
  • Certificate:
  • CE ISO
  • Model:
  • XJP-607
  • Microscope type:
  • industrial microscope
  •  
Packaging & Delivery
  • Packaging Details:
  • wooden
  • Delivery Time:
  • 7 days after payment
Product Description

HIP-XJP-607 Industrial Metallurgical microscope is developed and aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry. Used as an advanced Metallurgical microscope, the user can experience its super performance when using it.It can be widely used to identify and analyze Semiconductor, FPD, Circuit encapsulation, circuit substrate, Material, Casting/Metal/Ceramic parts, Precision moulds and observe thicker specimen. High quality and reliable optical system brings much clearer and contrast image. The design meets with the ergonomics needs and makes you feel comfortable and relaxed in doing your job.

Specification               
Viewing Head   Compensation Free Trinocular Head, Inclined 30°(50mm-75mm)
Eyepiece   WF10×/25mm
  WF10×/20mm,crosshair with reticule 0.1mm
Objective Long working distance bright and dark field Infinite Plan objectives: 5 ×/0.1B.D/W.D.29.4mm 10×/0.25B.D/W.D.16mm  20×/0.40B.D/W.D.10.6mm 40 ×/0.60B.D/W.D.5.4mm
Nosepiece   Quintuple Nosepiece with DIC Jack
Stage   Double layer mechanical stage
  Stage Size: 190mm×140mm
  Moving Range:50mm×40mm
Filter   Flashboard type filters(green,blue,neutral)
Focusing Coaxial coarse &fine focusing adjustment With rack and pinion mechanism Fine focusing scale value 0.002mm
Light Source With aperture iris diaphragm and field iris diaphragm, halogen Bulb 12V/50W,  AC85V-230 Brightness Adjustable
Polarizing Device Analyzer rotatable 360,°Polarizer&Analyzer can be moved in/out of the optical path
Checking Tool   0.01mm Micrometer
Optional Accessory   Two-dimensional measurement software
  Professional metallurgical image analysis software
  Halogen Bulb 12V/100W
  Micrometer eyepiece
  1.3Mega,2.0 Mega,3.0 Mega,5.0 Mega pixels CMOS Digital camera eyepieces
Long working distance bright & dark field Infinite Plan objectives: 50 ×/0.55B.D/W.D.5.1mm, 80×/0.75B.D/W.D.4mm,100×/0.80B.D/W.D.3mm
Precision Stage:X-Y moving range 25mm×25mm,Moving Precision<5um,Digital hand wheel Min.Value:0.1um,360°Rotatable disc
  Photography attachment and CCD Adapter 0.5×,0.57×,0.75×
  DIC(10×,20×,40×,100×)
  Planishing tool
  CCD Camera,colour 1/3″High resolution 520 TV lines

Characteristicsand description
 
1.       UIS infinite-optical system.

2.       Adopt long-life halogen light source with much higher light efficiency.

3.       Bright and dark field, Polarization and differential interference function.

4.       The aspherical Kohler illumination, increasing the brightness of observation.

5.       WF10 ×(Φ25)Super wide viewing field Eyepiece, long working distance

          metallurgical objective with bright and dark field

6.       The Quintuple Nosepiece can be equipped with detachable DIC differential
          interference device.
 
DIC: Nomarski differential interference contrast observation is deemed to the essential means to checkout the materials, semiconductor and metal structure now.

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